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Abstract

The polarisation of X-rays emitted during K shell dielectronic recombination(DR) into highly charged ions was studied using electron beam ion traps. In the first experiment, the degree of linear polarisation of X-rays due to K shell DRtransitions of highly charged krypton ions was measured with a newly developedCompton polarimeter based on SiPIN diodes. Such polarisation measurements allowa study of the population mechanism of magnetic sublevels in collisions betweenelectrons and ions. In a second experiment, the influence of Breit interaction between electrons on the polarisation of X-rays emitted during K shell DR into highly charged xenon ions was studied. Here, polarisation measurements provide an access to the finer details of the electron-electron interaction in electron-ion collisions. Furthermore, a second Compton polarimeter based on silicon drift detectorshas been developed for polarisation measurements at synchrotrons. It has been developed for X-ray polarimetry with a high energy resolution for energies between 6 keV and 35 keV. It was tested in the course of polarisation measurements at an electron beam ion trap and at a synchrotron radiation source.