%0 Generic
%A Jörg, Holger Eric
%C Universitätsbibliothek Heidelberg
%D 2017
%F heidok:22596
%R 10.11588/heidok.00022596
%T Compton Polarimetry of 6 - 35 keV X-rays: Influence of Breit Interaction on the Linear Polarisation of KLL Dielectronic Recombination Transitions in Highly Charged Ions
%U https://archiv.ub.uni-heidelberg.de/volltextserver/22596/
%X The polarisation of X-rays emitted during K shell dielectronic recombination(DR) into highly charged ions was studied using electron beam ion traps. In the first experiment, the degree of linear polarisation of X-rays due to K shell DRtransitions of highly charged krypton ions was measured with a newly developedCompton polarimeter based on SiPIN diodes. Such polarisation measurements allowa study of the population mechanism of magnetic sublevels in collisions betweenelectrons and ions. In a second experiment, the influence of Breit interaction between  electrons on the polarisation of X-rays emitted during K shell DR into highly charged xenon ions was studied. Here, polarisation measurements provide an access  to the finer details of the electron-electron interaction in electron-ion collisions.  Furthermore, a second Compton polarimeter based on silicon drift detectorshas been developed for polarisation measurements at synchrotrons. It has been developed for X-ray polarimetry with a high energy resolution for energies between 6 keV and 35 keV. It was tested in the course of polarisation measurements at an electron beam ion trap and at a synchrotron radiation source.