eprintid: 2950
rev_number: 8
eprint_status: archive
userid: 1
dir: disk0/00/00/29/50
datestamp: 2002-09-18 00:00:00
lastmod: 2014-04-03 12:25:50
status_changed: 2012-08-14 15:06:18
type: doctoralThesis
metadata_visibility: show
creators_name: Failla, Antonio Virgilio
title: Advanced methods in Spatially Modulated Illumination (SMI) microscopy
ispublished: pub
subjects: ddc-530
divisions: i-851310
adv_faculty: af-13
keywords: microscopiemicroscopy
cterms_swd: xxx
abstract_translated_text: In this dissertation a new virtual microscopy appoach is presented in order to  investigate the potentiality of spatially modulated illumination microscopy in  topology  investigation and nanosizing. Exerimental measuremnts will follow to  all the theoretical previsions. Virtual microscopy evaluations and experiment measurements indicate that with spatially modulated illumination microscopy axial distance measurements in the  one naonmeter range are feasible and, for the first time in farl field light  micrsoscopy subwavelength size measurements down to 30 nm can be performed.    
abstract_translated_lang: eng
class_scheme: msc
date: 2002
date_type: published
id_scheme: DOI
id_number: 10.11588/heidok.00002950
ppn_swb: 1643348132
own_urn: urn:nbn:de:bsz:16-opus-29500
date_accepted: 2002-07-03
advisor: HASH(0x55fc36c7cf08)
language: eng
bibsort: FAILLAANTOADVANCEDME2002
full_text_status: public
citation:   Failla, Antonio Virgilio  (2002) Advanced methods in Spatially Modulated Illumination (SMI) microscopy.  [Dissertation]     
document_url: https://archiv.ub.uni-heidelberg.de/volltextserver/2950/1/tesi2.pdf