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LAI assessing of wheat stands from AISA-DUAL imagery

Jarmer, Thomas ; Siegmann, Bastian ; Lilienthal, Holger ; Höfle, Bernhard ; Selige, Thomas ; Richter, Nicole

In: Proceedings of the 8th EARSeL Workshop on Imaging Spectroscopy, Nantes, France. . 2013, 5 S.

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Citation of documents: Please do not cite the URL that is displayed in your browser location input, instead use the DOI, URN or the persistent URL below, as we can guarantee their long-time accessibility.
Document type: Book Section
Title of Book: Proceedings of the 8th EARSeL Workshop on Imaging Spectroscopy, Nantes, France
Publisher: .
Date Deposited: 07 Aug 2025 13:06
Date: 2013
Page Range: 5 S.
Event Dates: 8-10 April 2013
Event Location: Nantes, France
Event Title: 8th EARSeL SIG Imaging Spectroscopy Workshop
Faculties / Institutes: Fakultät für Chemie und Geowissenschaften > Institute of Geography
DDC-classification: 550 Earth sciences
Uncontrolled Keywords: Leaf area index, wheat, AISA-DUAL, spectral resolution, PLSR
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