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Compton Polarimetry of 6 - 35 keV X-rays: Influence of Breit Interaction on the Linear Polarisation of KLL Dielectronic Recombination Transitions in Highly Charged Ions

Jörg, Holger Eric

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Abstract

The polarisation of X-rays emitted during K shell dielectronic recombination(DR) into highly charged ions was studied using electron beam ion traps. In the first experiment, the degree of linear polarisation of X-rays due to K shell DRtransitions of highly charged krypton ions was measured with a newly developedCompton polarimeter based on SiPIN diodes. Such polarisation measurements allowa study of the population mechanism of magnetic sublevels in collisions betweenelectrons and ions. In a second experiment, the influence of Breit interaction between electrons on the polarisation of X-rays emitted during K shell DR into highly charged xenon ions was studied. Here, polarisation measurements provide an access to the finer details of the electron-electron interaction in electron-ion collisions. Furthermore, a second Compton polarimeter based on silicon drift detectorshas been developed for polarisation measurements at synchrotrons. It has been developed for X-ray polarimetry with a high energy resolution for energies between 6 keV and 35 keV. It was tested in the course of polarisation measurements at an electron beam ion trap and at a synchrotron radiation source.

Item Type: Dissertation
Supervisor: Crespo López-Urrutia, PD Dr. José R.
Place of Publication: Universitätsbibliothek Heidelberg
Date of thesis defense: 21 December 2016
Date Deposited: 09 Feb 2017 08:59
Date: 2017
Faculties / Institutes: The Faculty of Physics and Astronomy > Institute of Physics
Subjects: 530 Physics
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