Translation of abstract (English)
In this dissertation a new virtual microscopy appoach is presented in order to investigate the potentiality of spatially modulated illumination microscopy in topology investigation and nanosizing. Exerimental measuremnts will follow to all the theoretical previsions. Virtual microscopy evaluations and experiment measurements indicate that with spatially modulated illumination microscopy axial distance measurements in the one naonmeter range are feasible and, for the first time in farl field light micrsoscopy subwavelength size measurements down to 30 nm can be performed.
|Supervisor:||C. Cremer, Prof|
|Date of thesis defense:||3 July 2002|
|Date Deposited:||18 Sep 2002 00:00|
|Faculties / Institutes:||Service facilities > Max-Planck-Institute allgemein > MPI for Astronomy|