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Advanced methods in Spatially Modulated Illumination (SMI) microscopy

Failla, Antonio Virgilio

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Translation of abstract (English)

In this dissertation a new virtual microscopy appoach is presented in order to investigate the potentiality of spatially modulated illumination microscopy in topology investigation and nanosizing. Exerimental measuremnts will follow to all the theoretical previsions. Virtual microscopy evaluations and experiment measurements indicate that with spatially modulated illumination microscopy axial distance measurements in the one naonmeter range are feasible and, for the first time in farl field light micrsoscopy subwavelength size measurements down to 30 nm can be performed.

Item Type: Dissertation
Supervisor: C. Cremer, Prof
Date of thesis defense: 3. July 2002
Date Deposited: 18. Sep 2002 00:00
Date: 2002
Faculties / Institutes: Service facilities > Max-Planck-Institute allgemein > MPI for Astronomy
Subjects: 530 Physics
Controlled Keywords: xxx
Uncontrolled Keywords: microscopiemicroscopy
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